Advanced Scanning Electron Microscopy and X-Ray Microanalysis / Edition 1

Advanced Scanning Electron Microscopy and X-Ray Microanalysis / Edition 1

ISBN-10:
0306421402
ISBN-13:
9780306421402
Pub. Date:
03/31/1986
Publisher:
Springer US
ISBN-10:
0306421402
ISBN-13:
9780306421402
Pub. Date:
03/31/1986
Publisher:
Springer US
Advanced Scanning Electron Microscopy and X-Ray Microanalysis / Edition 1

Advanced Scanning Electron Microscopy and X-Ray Microanalysis / Edition 1

Hardcover

$199.99
Current price is , Original price is $199.99. You
$199.99 
  • SHIP THIS ITEM
    Qualifies for Free Shipping
  • PICK UP IN STORE
    Check Availability at Nearby Stores
  • SHIP THIS ITEM

    Temporarily Out of Stock Online

    Please check back later for updated availability.


Overview

This book has its origins in the intensive short courses on scanning elec­ tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972. In order to provide a textbook containing the materials presented in the original course, the lecturers collaborated to write the book Practical Scanning Electron Microscopy (PSEM), which was published by Plenum Press in 1975. The course con­ tinued to evolve and expand in the ensuing years, until the volume of material to be covered necessitated the development of separate intro­ ductory and advanced courses. In 1981 the lecturers undertook the project of rewriting the original textbook, producing the volume Scan­ ning Electron Microscopy and X-Ray Microanalysis (SEMXM). This vol­ ume contained substantial expansions of the treatment of such basic material as electron optics, image formation, energy-dispersive x-ray spectrometry, and qualitative and quantitative analysis. At the same time, a number of chapters, which had been included in the PSEM vol­ ume, including those on magnetic contrast and electron channeling con­ trast, had to be dropped for reasons of space. Moreover, these topics had naturally evolved into the basis of the advanced course. In addition, the evolution of the SEM and microanalysis fields had resulted in the development of new topics, such as digital image processing, which by their nature became topics in the advanced course.

Product Details

ISBN-13: 9780306421402
Publisher: Springer US
Publication date: 03/31/1986
Edition description: 1986
Pages: 454
Product dimensions: 6.40(w) x 9.30(h) x 1.30(d)

Table of Contents

1. Modeling Electron Beam-Specimen Interactions.- 2. SEM Microcharacterization of Semiconductors.- 3. Electron Channeling Contrast in the SEM.- 4. Magnetic Contrast in the SEM.- 5. Computer-Aided Imaging and Interpretation.- 6. Alternative Microanalytical Techniques.- 7. Specimen Coating.- 8. Advances in Specimen Preparation for Biological SEM.- 9. Cryomicroscopy.- References.
From the B&N Reads Blog

Customer Reviews