Advances in Imaging and Electron Physics

by Martin Hÿtch (Editor), Peter W. Hawkes (Editor)

Overview

Advances in Imaging and Electron Physics, Volume 219, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

• Contains contributions from leading authorities on the subject matter
• Informs and updates on the latest developments in the field of imaging and electron physics
• Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electrons and ion emission with a valuable resource
• Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing

Product Details

ISBN-13:	9780128246122
Publisher:	Elsevier Science
Publication date:	08/27/2021
Series:	Advances in Imaging and Electron Physics , #219
Pages:	340
Product dimensions:	6.00(w) x 9.00(h) x 0.81(d)

About the Author

Dr Martin Hÿtch, serial editor for the book series “Advances in Imaging and Electron Physics (AIEP)”, is a senior scientist at the French National Centre for Research (CNRS) in Toulouse. He moved to France after receiving his PhD from the University of Cambridge in 1991 on “Quantitative high-resolution transmission electron microscopy (HRTEM)”, joining the CNRS in Paris as permanent staff member in 1995. His research focuses on the development of quantitative electron microscopy techniques for materials science applications. He is notably the inventor of Geometric Phase Analysis (GPA) and Dark-Field Electron Holography (DFEH), two techniques for the measurement of strain at the nanoscale. Since moving to the CEMES-CNRS in Toulouse in 2004, he has been working on aberration-corrected HRTEM and electron holography for the study of electronic devices, nanocrystals and ferroelectrics. He was laureate of the prestigious European Microscopy Award for Physical Sciences of the European Microscopy Society in 2008. To date he has published 130 papers in international journals, filed 6 patents and has given over 70 invited talks at international conferences and workshops.

Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.

Table of Contents

Preface Martin Hÿtch and Peter W. Hawkes 1. Introduction to strain characterization method in transmission electron microscopy Alexandre Pofelski? 2. Moiré sampling in scanning transmission electron microscopy Alexandre Pofelski? 3. Scanning transmission electron microscopy moiré sampling geometrical phase analysis (STEM moiré GPA) Alexandre Pofelski? 4. Performance of scanning transmission electron microscopy moiré sampling geometrical phase analysis Alexandre Pofelski? 5. Applications of scanning transmission electron microscopy moiré sampling geometrical phase analysis Alexandre Pofelski? 6. Quasi-analytical modelling of charged particle ensembles in neutral gas flow and electric fields Mikhail Monastyrskiy, Roman Ablizen, Anatoly Neishtadt, Alexander Makarov, and Mikhail 7. Superconducting electron lenses David Hardy 8. Lorentz microscopy or electron phase microscopy of magnetic objects Richard Harry Wade

What People are Saying About This

From the Publisher

Edited by one of the best scientists in the field, this series presents updates in the fields of imaging and electron physics

Editorial Reviews

The four surveys contained in this volume illustrate widely diverse aspects of imaging and electron physics. The first two chapters address applications of electron microscopy, including the role of this technique in mineralogy and a study of the high- resolution electron microscopy of quasicrystals. The latter is actually a short monograph presenting the underlying crystallography and explaining in detail how the corresponding images and diffraction patterns should be interpreted. The third contribution is an account of a new approach to deconvolution in image processing in which the author, by associating a polynomial with the gray-level values of (discrete) images, shows that it is possible to invert the convolutional relation that describes many kinds of image formation. The volume ends with a detailed discussion of the dual de Broglie wave, including a critical account of new developments in the debate over the existence and role of such a wave. Annotation c. by Book News, Inc., Portland, Or.

Booknews

"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. The Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest."
—J.A. Chapman in LABORATORY PRACTICE

From the Publisher