Advances in Imaging and Electron Physics: The Scanning Transmission Electron Microscope
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. This particular volume presents several timely articles on the scanning transmission electron microscope. - Updated with contributions from leading international scholars and industry experts - Discusses hot topic areas and presents current and future research trends - Provides an invaluable reference and guide for physicists, engineers and mathematicians
1111447645
Advances in Imaging and Electron Physics: The Scanning Transmission Electron Microscope
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. This particular volume presents several timely articles on the scanning transmission electron microscope. - Updated with contributions from leading international scholars and industry experts - Discusses hot topic areas and presents current and future research trends - Provides an invaluable reference and guide for physicists, engineers and mathematicians
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Advances in Imaging and Electron Physics: The Scanning Transmission Electron Microscope

Advances in Imaging and Electron Physics: The Scanning Transmission Electron Microscope

by Peter W. Hawkes (Editor)
Advances in Imaging and Electron Physics: The Scanning Transmission Electron Microscope

Advances in Imaging and Electron Physics: The Scanning Transmission Electron Microscope

by Peter W. Hawkes (Editor)

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Overview

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. This particular volume presents several timely articles on the scanning transmission electron microscope. - Updated with contributions from leading international scholars and industry experts - Discusses hot topic areas and presents current and future research trends - Provides an invaluable reference and guide for physicists, engineers and mathematicians

Product Details

ISBN-13: 9780080961583
Publisher: Elsevier Science & Technology Books
Publication date: 11/05/2009
Series: Advances in Imaging and Electron Physics , #159
Sold by: Barnes & Noble
Format: eBook
Pages: 320
File size: 14 MB
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About the Author

Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.

Table of Contents

The beginnings and development of the scanning transmission electron microscope (STEM)Albert V. CreweSTEM in the life sciencesAndreas EngelThe AEI and Siemens STEM instrumentsPeter HawkesSTEM in JapanHiromi InadaEarly work on the STEMMichael S. IsaacsonThe Toulouse high-voltage STEM projectBernard JouffreyAberration-corrected STEMOndrej KrivanekSTEM in CambridgeK.C.A. SmithA review of the cold field electron cathodeLyn Swanson and Greg SchwindSTEM in Oxford and at Vacuum GeneratorsSebastian von HarrachThe Vacuum Generators STEMIan Wardell and Peter BoveyHistorical background of the STEM at Brookhaven National LaboratoryJoseph Wall
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