Electron and Ion Microscopy and Microanalysis: Principles and Applications, Second Edition, / Edition 2

by Lawrence E Murr

Overview

The publication date of the first edition is not stated, but the new edition is apparently considerably revised and expanded. It was written to serve as a multi-purpose text at the senior or graduate level and as a reference for the practicing scientist or engineer. Readers should have a math backgr

Product Details

ISBN-13:	9780824785567
Publisher:	Taylor & Francis
Publication date:	07/25/1991
Series:	Optical Science and Engineering Series , #29
Edition description:	REV
Pages:	856
Product dimensions:	7.00(w) x 10.00(h) x (d)

About the Author

Lawrence E. Murr

Table of Contents

CHAPTER 1: FUNDAMENTAL PROPERTIES OF ELECTRONS AND IONS. CHAPTER 2: ELECTRON EMISSION AND EMISSION AND IONIZATION MICROSCOPY. CHAPTER. 3: ELECTRON AND ION OPTICS AND OPTICAL SYSTEMS. CHAPTER 4: ELECTRON AND ION PROBE MICROANALYSIS. CHAPTER 5: ELECTRON AND ION MICROSCOPY OF SURFACES. CHAPTER 6: ELECTRON DIFFRACTION. CHAPTER 7: TRANSMISSION ELECTRON MICROSCOPY. CHAPTER 8: HIGH-VOLTAGE ELECTRON MICROSCOPY.