Handbook of X-Ray Spectrometry / Edition 2

by Rene Van Grieken, A. Markowicz

Overview

"Updates fundamentals and applications of all modes of x-ray spectrometry, including total reflection and polarized beam x-ray fluorescence analysis, and synchrotron radiation induced x-ray emission. Promotes the accurate measurement of samples while reducing the scattered background in the x-ray spectrum."

Product Details

ISBN-13:	9780824706005
Publisher:	Taylor & Francis
Publication date:	11/27/2001
Series:	Practical Spectroscopy
Edition description:	REV
Pages:	1004
Product dimensions:	8.25(w) x 11.00(h) x (d)

About the Author

Rene van GriekenAndrzej Markowicz

Table of Contents

X-ray physics; wavelength-dispersive X-ray fluorescence; energy-dispersive x-ray flourescences; data analysis; quantification in XRF analysis of infinitely thick samples; quantification in XRF analysis of intermediate-thickness samples; radioisotope X-ray analysis; synchrotron radiation X-ray emission; total-reflection XRF; polarized beam XRF; capillary beam XRF or X-ray micro-flourescence; particle-induced X-ray emission; electron-induced X-ray emission; sample preparation for XRF.

Editorial Reviews

"Industry accolades for the previous edition. . . . . .should be available to all workers in x-ray analysis, and they should do more than just scan the various chapters, but read them in detail....anyone who does that will learn something, regardless of how long they have been working in the field."
—-X-Ray Spectrometry

From the Publisher