Improving Efficiency by Shrinkage: The James--Stein and Ridge Regression Estimators / Edition 1

by Marvin Gruber

Overview

Offers a treatment of different kinds of James-Stein and ridge regression estimators from a frequentist and Bayesian point of view. The book explains and compares estimators analytically as well as numerically and includes Mathematica and Maple programs used in numerical comparison.;College or university bookshops may order five or more copies at a special student rate, available on request.

Product Details

ISBN-13:	9780824701567
Publisher:	Taylor & Francis
Publication date:	02/26/1998
Series:	Statistics: A Series of Textbooks and Monographs , #156
Edition description:	New Edition
Pages:	652
Product dimensions:	6.00(w) x 9.00(h) x (d)

About the Author

Marvin Gruber

Table of Contents

Introduction to shrinkage estimators: the Stein paradox; the ridge estimators of Hoerl and Kennard. Estimation for a single linear model: the James-Stein estimator for a single model; ridge estimators from different general points of view; improving the James-Stein estimator - the positive parts. Other linear model setups: the simultaneous estimation problem; precision of individual estimators; the multivariate model; other linear model setups.

Editorial Reviews

"The author has done a great job in writing the materials. The book is more on the theoretical and mathematical side than on the application side. The estimators and the results discussed in the book will be useful to practitioners in the physical, chemical, and engineering sciences. The book is a very good addition to the literature on James-Stein and ridge estimators. "
—-Technometrics
". . .an essential library purchase. "
—-Short Book Reviews of the International Statistical Institute
". . .recommended as a textbook for graduate students. . .[and] as a research monograph for professionals in statistics, engineering and econometrics who are interested to know how to improve upon the traditional estimators in regressional analysis."
—-Statistical Papers

From the Publisher