Microscopy of Semiconducting Materials 1983, Third Oxford Conference on Microscopy of Semiconducting Materials, St Catherines College, March 1983

by A.G. Cullis

Overview

This volume contains invited and contributed papers at the conference on Microscopy of Semiconducting Materials which took place on 21–23 March 1983 in St Cathernine's College, Oxford. The conference was the third in the series devoted to advances in microscopical studies of semiconductors.

Product Details

ISBN-13:	9781000156973
Publisher:	CRC Press
Publication date:	11/25/2020
Sold by:	Barnes & Noble
Format:	eBook
Pages:	300
File size:	17 MB
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About the Author

A. G. Cullis (Author) ,  S. M. Davidson (Edited by) ,  G. R. Booker (Edited by)

Table of Contents

Section 1 Structure and properties of dislocations, Section 2 High resolution microscopy, Section 3 Transient annealing phenomena, Section 4 Silicon characterisation, Section 5 Compund semiconductor characterization, Section 6 Scanning EBIC and CL, Section 7 X-ray techniques, Section 8 Non-conventional microscopy, Section 9 Device assement by scanning microscopy, Section 10 Device assessment by transmisison microscopy.