Principles of Testing Electronic Systems / Edition 1

by Samiha Mourad, Yervant Zorian

Overview

Mit ausgesprochen pragmatischer Herangehensweise entwickelt dieses Buch ein phänomenologisches Verständnis der Prinzipien zur Testung elektronischer Schaltkreise. Anschauliche Beispiele und praktische Anwendungen empfehlen den Band nicht nur als Studienbegleiter, sondern auch als Nachschlagewerk für den Berufsalltag. Bildmaterial für Lehrveranstaltungen ist im Web abrufbar. (07/00)

Product Details

ISBN-13:	9780471319313
Publisher:	Wiley
Publication date:	07/25/2000
Pages:	440
Product dimensions:	6.48(w) x 9.43(h) x 0.99(d)

About the Author

SAMIHA MOURAD, PhD, is Professor of Electrical Engineering at Santa Clara University, Santa Clara, California. YERVANT ZORIAN, PhD, is Chief Technology Advisor at Logic Vision, Inc., San Jose, California.

Table of Contents

DESIGN AND TEST.

Overview of Testing.

Defects, Failures, and Faults.

Design Representation.

VLSI Design Flow.

TEST FLOW.

Role of Simulation in Testing.

Automatic Test Pattern Generation.

Current Testing.

DESIGN FOR TESTABILITY.

Ad Hoc Test Techniques.

Scan-Path Design.

Boundary-Scan Testing.

Built-in Self-Test.

SPECIAL STRUCTURES.

Memory Testing.

Testing FPGAs and Microprocessors.

ADVANCED TOPICS.

Synthesis for Testability.

Testing SOCs.

Appendices.

Index.

Editorial Reviews

"Highly recommended for libraries serving undergraduate and graduate electrical engineering students and professional practitioners." (Choice, Vol. 38, No. 7, March 2001)

From the Publisher

Highly recommended for libraries serving undergraduate and graduate electrical engineering students and professional practitioners.

Choice

Relates design and test to the development of reliable electronic products. The authors, one from academia and the other from industry, show the main vehicles for design verification, examine designs that facilitate testing, and investigate how testing is applied to random logic, memories, FPGAs, and microprocessors. Topics include scan-path and ordering of scan-chains, BIST solutions for embedded logic and memory blocks, and testing system-on-a-chip. The book is intended for practicing engineers involved in testing and design for test who have not had an opportunity to study the field in a systematic fashion. Annotation c. Book News, Inc., Portland, OR (booknews.com)

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