Reliability of Software Intensive Systems

by Michael A. Friedman, Phuong Y. Tran, Peter I. Goddard

Overview

Reliability of Software Intensive Systems

Product Details

ISBN-13:	9780815513612
Publisher:	Elsevier Science
Publication date:	01/01/1995
Series:	Advanced Computing and Telecommunication Series
Pages:	404
Product dimensions:	6.88(w) x 9.62(h) x (d)

Table of Contents

Part I Reliability Techniques for Combined Hardware and Software Systems 1. Introduction 1.1 Scope 1.2 Research Problem Background 1.3 Approach 1.4 Report Organization 1.5 Introductory Concepts 2. System and Software Modeling/Combination 2.1 Development of the System Model 3. Reliability Decomposition and Allocation 3.1 Approach 3.2 Results 4. Software Reliability Prediction 4.1 Approach 4.2 Results 5. Reliability Growth Testing 5.1 Approach 5.2 Results 6. Reliability Demonstration 6.1 Approach 6.2 Results 7. Validation 7.1 Approach 7.2 Results 8. Conclusions and Recommendations 8.1 Conclusions 8.2 Recommendations Appendix A—Reliability Database Appendix B—Constant Failure Rate Model for Software Appendix C—Dynamic Allocation C.1 Assumptions C.2 Notation C.3 Dynamic Allocation Technique Appendix D—Early Prediction of Program Size D.1 Successive Ratings Method D.2 Pairwise Comparisons D.3 Paired Comparisons Method Appendix E—Multivariate Regression Analysis E.1 Multivariate Linear Regression Model Development E.2 Multivariate Nonlinear Regression Models Development E.3 Notation ReferencesPart II Hardware/Software Reliability Assurance and Control 1. Introduction 1.1 Purpose 1.2 Application 2. Applicable Documents 2.1 Military Documents 2.2 Non-Military Documents 3. Definitions and Symbols 3.1 Definitions of Terms 3.2 Abbreviations 3.3 Mathematical Symbols 4. General Requirements 4.1 System Reliability Prediction and Estimation Program 4.2 Hardware Reliability Prediction and Estimation Program 4.3 Software Reliability Prediction and Estimation Program 5. Detailed Requirements 5.1 Hardware/Software System Reliability Modeling 5.2 Reliability Allocation 5.3 Prediction 5.4 Growth and Demonstration Testing 5.5 Defect Prevention