Scanning Force Microscopy: With Applications to Electric, Magnetic, and Atomic Forces / Edition 2

by Dror Sarid

Overview

Scanning tunneling microscopy (STM), invented by Binnig and Rohrer in 1982, enables one to obtain images reflecting surface electronic structure with atomic resolution. As an offshoot of this technology, Binnig, Quate and Gerber in 1986 invented atomic force microscopy (AFM), also capable of achieving atomic resolution. By now this technology proved to be an indispensable characterization tool with applications to surface physics and chemistry, material science, bio-science and data storage media, with promise in such areas as the semiconductor industry and optical quality control, for example. This book is the first attempt at organizing the whole rainbow of rapidly developing topics dealing with the mapping of a variety of forces across surfaces. Academic and industrial researchers using STM, or wishing to know more about its potential, will find this book a valuable source of up-to-date information.

Product Details

ISBN-13:	9780195092042
Publisher:	Oxford University Press
Publication date:	08/25/1994
Series:	Oxford Series in Optical and Imaging Sciences , #5
Edition description:	Rev. ed
Pages:	288
Product dimensions:	6.38(w) x 9.50(h) x 0.92(d)

About the Author

University of Arizona

Table of Contents

PART ONE: LEVERS AND NOISE1. Mechanical Properties of Levers2. Resonance Enhancement3. Sources of NoisesPART TWO: SCANNING FORCE MICROSCOPES4. Tunneling Detection Systems5. Capacitance Detection Systems6. Homodyne Detection Systems7. Heterodyne Detection Systems8. Laser-Diode Feedback Detection Systems9. Polarization Detection Systems10. Deflection Detection SystemsPART THREE: SCANNING FORCE MICROSCOPY11. Electric Force Microscopy12. Magnetic Force Microscopy13. Atomic Force Microscopy

Editorial Reviews

From reviews of the first edition: "Quite instructive as to the capabilities and limitations of the SFM, and should ignite the enthusiasm of those unconverted to high resolution microscopy." —Journal of Colloid and Interface Science

"A valuable contribution to the literature, providing a sound theoretical basis." —Journal of Solid State Chemistry

"A useful introductory source. Its major strength is its concise overview of the different detection methods available and the theoretical noise floor available with each. . . . useful for its discussion of noise sources, and as a supplement to review articles already published in the field." —Andrew A. Gewirth (University of Illinois), Microscopy Research and Technique

"One of the nicest features of the book is a fairly comprehensive, full title, reference list complete to early 1993. Highly recommended to any microscopist working in force microscopy, especially in light of its low cover price."—Microscope

"Presents a theoretical background for scanning force microscopy (SFM) starting from first principles, with experimental and technical information incorporated into each chapter."—Materials Research Bulletin

From the Publisher

Summarizes the current state of scanning tunneling microscopy, invented in 1982, and now widely used in the atomic-level analysis of surface structures. Reviews the basic theory and explains such variations as inverse photoemission, conductance, force, thermal, and near-field optical. For industrial or academic researchers using, or thinking of using, the technique. Annotation c. Book News, Inc., Portland, OR (booknews.com)

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