Scanning Microscopy for Nanotechnology: Techniques and Applications / Edition 1

Scanning Microscopy for Nanotechnology: Techniques and Applications / Edition 1

ISBN-10:
0387333258
ISBN-13:
9780387333250
Pub. Date:
11/27/2006
Publisher:
Springer New York
ISBN-10:
0387333258
ISBN-13:
9780387333250
Pub. Date:
11/27/2006
Publisher:
Springer New York
Scanning Microscopy for Nanotechnology: Techniques and Applications / Edition 1

Scanning Microscopy for Nanotechnology: Techniques and Applications / Edition 1

$249.99
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Overview

Scanning electron microscopy (SEM) can be exploited not only for nanomaterials characterization but also integrated with new technologies for in-situ nanomaterials engineering and manipulation. Scanning Microscopy for Nanotechnology addresses the rapid development of these techniques for nanotechnology, in both technique and application chapters by leading practitioners. The book covers topics including nanomaterials imaging, X-ray microanalysis, high-resolution SEM, low kV SEM, cryo-SEM, as well as new techniques such as electron back scatter diffraction (EBSD) and scanning transmission electron microscopy (STEM). Fabrication techniques integrated with SEM, such as e-beam nanolithography, nanomanipulation, and focused ion beam nanofabrication, are major new dimensions for SEM application. Application areas include the study of nanoparticles, nanowires and nanotubes, three-dimensional nanostructures, quantum dots, magnetic nanomaterials, photonic structures, and bio-inspired nanomaterials. This book will appeal not only to a broad spectrum of nanomaterials researchers, but also to SEM development specialists.


Product Details

ISBN-13: 9780387333250
Publisher: Springer New York
Publication date: 11/27/2006
Edition description: 2007
Pages: 522
Product dimensions: 6.10(w) x 9.25(h) x 0.04(d)

Table of Contents

Fundamentals of Scanning Electron Microscopy (SEM).- Backscattering Detector and EBSD in Nanomaterials Characterization.- X-ray Microanalysis in Nanomaterials.- Low kV Scanning Electron Microscopy.- E-beam Nanolithography Integrated with Scanning Electron Microscope.- Scanning Transmission Electron Microscopy for Nanostructure Characterization.- to In-Situ Nanomanipulation for Nanomaterials Engineering.- Applications of FIB and DualBeam for Nanofabrication.- Nanowires and Carbon Nanotubes.- Photonic Crystals and Devices.- Nanoparticles and Colloidal Self-assembly.- Nano-building Blocks Fabricated through Templates.- One-dimensional Wurtzite Semiconducting Nanostructures.- Bio-inspired Nanomaterials.- Cryo-Temperature Stages in Nanostructural Research.
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