Speckle Metrology / Edition 1

by R.S. Sirohi

Overview

This practical reference offers state-of-the-art coverage of speckle metrology and its value as a measuring technique in industry.;Examing every important aspect of the field, Speckle Metrology: surveys the origin of speckle displacement and decorrelation; presents procedures for deformation analysis and shape measurement of rough objects; explains particle image velocimetry (PIV), the processing of PIV records, and the design requirements of PIV equipment; discusses the applications of white light speckle methods and the production of artificial speckles; describes the measurement of surface roughness with laser speckles and polychromatic speckles; illustrates semiautomatic and automatic methods for the analysis of Young's fringes; calculates the variation of Young's fringes with the change in the microrelief of the rough surface; and explicates hololenses for imaging and provides design details with aberration corrections for hololense systems.;With over 1500 literature citations, tables, figures and display equations, Speckle Metrology is a resource for students and professionals in the fields of optical, mechanical, electrical and electronics engineering; applied physics; and stress analysis.

Product Details

ISBN-13:	9780824789329
Publisher:	Taylor & Francis
Publication date:	05/20/1993
Series:	Optical Science and Engineering , #38
Pages:	572
Product dimensions:	6.00(w) x 9.00(h) x (d)

About the Author

R. S Sirohi (Author)

Table of Contents

Theory and applications of speckle displacement and decorrelation, I. Yamaguchi; techniques of displacement and deformation measurements in speckle metrology, Pramod K. Rastogi; speckle methods in experimental mechanics, Rajpal S. Sirohi; recent developments in video speckle interferometry, Ole J. Lokberg; novel applications of speckle metrology, Chandra S. Vikram; particle image velocimetry (PIV), K.D. Hinsch; white light speckle metrology, Anand K. Asundi; surface roughness evaluation, J.D. Briers; automatic fringe analysis procedures in speckle metrology, G.H. Kaufmann; speckle metrology using hololenses, Chandra Shahker; correlation speckle interferometry in the mechanics of contact interaction, Yu I. Ostrovsky and V.P. Shchepinov.

Editorial Reviews

". . .an important addition to this field. "
—-Optics & Photonics News
". . .a good book. . ..covers most of the important aspects of speckle metrology. "
—-Optical Engineering

From the Publisher