Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006, Proceedings

by Dit-Yan Yeung (Editor), James T. Kwok (Editor), Ana Fred (Editor), Fabio Roli (Editor), Dick de Ridder (Editor)

Overview

This is the proceedings of the 11th International Workshop on Structural and Syntactic Pattern Recognition, SSPR 2006 and the 6th International Workshop on Statistical Techniques in Pattern Recognition, SPR 2006, held in Hong Kong, August 2006 alongside the Conference on Pattern Recognition, ICPR 2006. 38 revised full papers and 61 revised poster papers are included, together with 4 invited papers covering image analysis, character recognition, bayesian networks, graph-based methods and more.

Product Details

ISBN-13:	9783540372363
Publisher:	Springer Berlin Heidelberg
Publication date:	09/15/2006
Series:	Lecture Notes in Computer Science , #4109
Edition description:	2006
Pages:	939
Product dimensions:	6.10(w) x 9.25(h) x 0.36(d)

Table of Contents

Invited Talks.- SSPR.- Poster Papers.- SPR.- Poster Papers.