Uncertainty Quantification of Stochastic Defects in Materials

by Liu Chu

Overview

Pursuing a comprehensive numerical analytical system, the book establishes a fundamental framework for this topic, while emphasizing the importance of stochastic and uncertainty quantification analysis and the significant influence of microstructure defects in the material macro properties.

Product Details

ISBN-13:	9781032128757
Publisher:	CRC Press
Publication date:	05/27/2024
Series:	Emerging Materials and Technologies
Pages:	210
Product dimensions:	6.12(w) x 9.19(h) x (d)

About the Author

Dr. Liu Chu received her B.E. degree in Materials Science and Engineering, and M.E. degree in Mechanics from Dalian Maritime University, China, and the Ph.D. in Mechanics from the Institut national des sciences appliquées de Rouen (INSA Rouen), France. Dr. Chu focuses on research in computational material mechanics and structural reliability. Her recent research interests include low-dimensional nanomaterial vacancy defects quantification, artificial material microstructure optimization, and mechanical structure reliability analysis. Since 2018, Dr. Chu has published 18 peer-reviewed science and technical papers in international journals and conferences. She is a member of IEEE and has served as a reviewer of several international journals.

Table of Contents

1. Overview. 2. Stochastic Defects. Part I: Methods and Theories. 3. Monte Carlo Methods. 4. Polynomial Chaos Expansion. 5. Stochastic Finite Element Method. 6. Machine Learning Methods. Part II: Examples. 7. Numerical Examples. 8. Monte Carlo-based Finite Element Method. 9. Impacts of Vacancy Defects in Resonant Vibration. 10. Uncertainty Quantification in Nanomaterial. 11. Equivalent Young’s Modulus Prediction. 12. Strengthen Possibility by Random Vacancy Defects.