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Influence of Temperature on Microelectronics and System Reliability: A Physics of Failure Approach
336![Influence of Temperature on Microelectronics and System Reliability: A Physics of Failure Approach](http://img.images-bn.com/static/redesign/srcs/images/grey-box.png?v11.9.4)
Influence of Temperature on Microelectronics and System Reliability: A Physics of Failure Approach
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Product Details
ISBN-13: | 9780429605598 |
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Publisher: | CRC Press |
Publication date: | 07/09/2020 |
Sold by: | Barnes & Noble |
Format: | eBook |
Pages: | 336 |
File size: | 25 MB |
Note: | This product may take a few minutes to download. |
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